Microelectronics Journal SCIE

國際簡稱：MICROELECTRON J 參考譯名：微電子雜志

主要研究方向：工程技術(shù)-工程：電子與電氣非預(yù)警期刊審稿周期：約3.0個(gè)月

《微電子雜志》(Microelectronics Journal)是一本由Elsevier出版的以工程技術(shù)-工程：電子與電氣為研究特色的國際期刊，發(fā)表該領(lǐng)域相關(guān)的原創(chuàng)研究文章、評論文章和綜述文章，及時(shí)報(bào)道該領(lǐng)域相關(guān)理論、實(shí)踐和應(yīng)用學(xué)科的最新發(fā)現(xiàn)，旨在促進(jìn)該學(xué)科領(lǐng)域科學(xué)信息的快速交流。該期刊是一本未開放期刊，近三年沒有被列入預(yù)警名單。

3區(qū) 中科院分區(qū)
Q3 JCR分區(qū)
293 年發(fā)文量
1.9 IF影響因子
未開放 是否OA
59 H-index
1967 創(chuàng)刊年份
Monthly 出版周期
English 出版語言

Published since 1969, the Microelectronics Journal is an international forum for the dissemination of research and applications of microelectronic systems, circuits, and emerging technologies. Papers published in the Microelectronics Journal have undergone peer review to ensure originality, relevance, and timeliness. The journal thus provides a worldwide, regular, and comprehensive update on microelectronic circuits and systems.

The Microelectronics Journal invites papers describing significant research and applications in all of the areas listed below. Comprehensive review/survey papers covering recent developments will also be considered. The Microelectronics Journal covers circuits and systems. This topic includes but is not limited to: Analog, digital, mixed, and RF circuits and related design methodologies; Logic, architectural, and system level synthesis; Testing, design for testability, built-in self-test; Area, power, and thermal analysis and design; Mixed-domain simulation and design; Embedded systems; Non-von Neumann computing and related technologies and circuits; Design and test of high complexity systems integration; SoC, NoC, SIP, and NIP design and test; 3-D integration design and analysis; Emerging device technologies and circuits, such as FinFETs, SETs, spintronics, SFQ, MTJ, etc.

Application aspects such as signal and image processing including circuits for cryptography, sensors, and actuators including sensor networks, reliability and quality issues, and economic models are also welcome.

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Microelectronics Journal期刊信息

ISSN：0026-2692
出版語言：English
是否OA：未開放
E-ISSN：1879-2391
出版地區(qū)：ENGLAND
是否預(yù)警：否
出版商：Elsevier
出版周期：Monthly
創(chuàng)刊時(shí)間：1967
開源占比：0.0103
Gold OA文章占比：2.61%
OA被引用占比：0.0096...
出版國人文章占比：0
出版撤稿占比：0
研究類文章占比：99.32%

Microelectronics Journal CiteScore評價(jià)數(shù)據(jù)（2024年最新版）

CiteScore

SJR

SNIP

CiteScore 指數(shù)

0.39

0.854

學(xué)科類別	分區(qū)	排名	百分位
大類：Physics and Astronomy 小類：Condensed Matter Physics	Q2	181 / 434	58%
大類：Physics and Astronomy 小類：Electrical and Electronic Engineering	Q2	332 / 797	58%
大類：Physics and Astronomy 小類：Atomic and Molecular Physics, and Optics	Q2	101 / 224	55%
大類：Physics and Astronomy 小類：Surfaces, Coatings and Films	Q2	61 / 132	54%
大類：Physics and Astronomy 小類：Electronic, Optical and Magnetic Materials	Q2	133 / 284	53%

名詞解釋：CiteScore 是衡量期刊所發(fā)表文獻(xiàn)的平均受引用次數(shù)，是在 Scopus 中衡量期刊影響力的另一個(gè)指標(biāo)。當(dāng)年CiteScore 的計(jì)算依據(jù)是期刊最近4年（含計(jì)算年度）的被引次數(shù)除以該期刊近四年發(fā)表的文獻(xiàn)數(shù)。例如，2022年的 CiteScore 計(jì)算方法為：2022年的 CiteScore =2019-2022年收到的對2019-2022年發(fā)表的文件的引用數(shù)量÷2019-2022年發(fā)布的文獻(xiàn)數(shù)量注：文獻(xiàn)類型包括：文章、評論、會(huì)議論文、書籍章節(jié)和數(shù)據(jù)論文。

Microelectronics Journal中科院評價(jià)數(shù)據(jù)

中科院 2023年12月升級(jí)版

Top期刊	綜述期刊	大類學(xué)科		小類學(xué)科
否	否	工程技術(shù)	3區(qū)	ENGINEERING, ELECTRICAL & ELECTRONIC 工程：電子與電氣 NANOSCIENCE & NANOTECHNOLOGY 納米科技	3區(qū) 4區(qū)

中科院 2022年12月升級(jí)版

Top期刊	綜述期刊	大類學(xué)科		小類學(xué)科
否	否	工程技術(shù)	3區(qū)	ENGINEERING, ELECTRICAL & ELECTRONIC 工程：電子與電氣 NANOSCIENCE & NANOTECHNOLOGY 納米科技	3區(qū) 4區(qū)

中科院 2021年12月舊的升級(jí)版

Top期刊	綜述期刊	大類學(xué)科		小類學(xué)科
否	否	工程技術(shù)	3區(qū)	ENGINEERING, ELECTRICAL & ELECTRONIC 工程：電子與電氣 NANOSCIENCE & NANOTECHNOLOGY 納米科技	4區(qū) 4區(qū)

中科院 2021年12月基礎(chǔ)版

Top期刊	綜述期刊	大類學(xué)科		小類學(xué)科
否	否	工程技術(shù)	4區(qū)	ENGINEERING, ELECTRICAL & ELECTRONIC 工程：電子與電氣 NANOSCIENCE & NANOTECHNOLOGY 納米科技	4區(qū) 4區(qū)

中科院 2021年12月升級(jí)版

Top期刊	綜述期刊	大類學(xué)科		小類學(xué)科
否	否	工程技術(shù)	3區(qū)	ENGINEERING, ELECTRICAL & ELECTRONIC 工程：電子與電氣 NANOSCIENCE & NANOTECHNOLOGY 納米科技	4區(qū) 4區(qū)

中科院 2020年12月舊的升級(jí)版

Top期刊	綜述期刊	大類學(xué)科		小類學(xué)科
否	否	工程技術(shù)	3區(qū)	ENGINEERING, ELECTRICAL & ELECTRONIC 工程：電子與電氣 NANOSCIENCE & NANOTECHNOLOGY 納米科技	4區(qū) 4區(qū)

Microelectronics Journal JCR評價(jià)數(shù)據(jù)（2023-2024年最新版）

按JIF指標(biāo)學(xué)科分區(qū)	收錄子集	分區(qū)	排名	百分位
學(xué)科：ENGINEERING, ELECTRICAL & ELECTRONIC	SCIE	Q3	211 / 352	40.2%
學(xué)科：NANOSCIENCE & NANOTECHNOLOGY	SCIE	Q4	110 / 140	21.8%

按JCI指標(biāo)學(xué)科分區(qū)	收錄子集	分區(qū)	排名	百分位
學(xué)科：ENGINEERING, ELECTRICAL & ELECTRONIC	SCIE	Q3	238 / 354	32.91%
學(xué)科：NANOSCIENCE & NANOTECHNOLOGY	SCIE	Q3	94 / 140	33.21%

Microelectronics Journal歷年數(shù)據(jù)統(tǒng)計(jì)

影響因子

中科院分區(qū)

Microelectronics Journal中國學(xué)者發(fā)文選摘

1、16-Cell stackable battery monitoring and management integrated circuit for electric vehicles
Author: Zhu, Guangqian; Qian, Libo; Li, Yongyuan; Guo, Wei; Ding, Ruixue; Yang, Yintang

Journal: MICROELECTRONICS JOURNAL. 2023; Vol. 136, Issue , pp. -. DOI: 10.1016/j.mejo.2023.105782
2、A wafer-level three-step calibration technique for BJT-based CMOS temperature sensor
Author: Gao, Ying; Liu, Xin; Jiang, Yanfeng

Journal: MICROELECTRONICS JOURNAL. 2023; Vol. 131, Issue , pp. -. DOI: 10.1016/j.mejo.2022.105671
3、Scalable modeling of grounded coplanar waveguide for MMICs design using neural network with an effective sampling strategy
Author: Hu, Yanghui; Zhang, Yuming; Lu, Hongliang; Tan, Daidao; Qi, Junjun

Journal: MICROELECTRONICS JOURNAL. 2023; Vol. 131, Issue , pp. -. DOI: 10.1016/j.mejo.2022.105670
4、A configurable area-efficient LCoS chip design with centrosymmetric pixel array
Author: Zhao, Tianhu; Liang, Yuhua; Feng, Lichen

Journal: MICROELECTRONICS JOURNAL. 2023; Vol. 131, Issue , pp. -. DOI: 10.1016/j.mejo.2022.105652
5、On-chip SRR and CSRR for millimeter-wave integrated systems: Review and applications
Author: Yang, Ke; Liang, Yuan; Zhang, Hao Chi; Feng, Guangyin

Journal: MICROELECTRONICS JOURNAL. 2023; Vol. 131, Issue , pp. -. DOI: 10.1016/j.mejo.2022.105664
6、A 10-MHz 85.1-dB SFDR 1.1-mW continuous-time Delta-sigma modulator employing calibration-free SC DAC and passive front-end low-pass filter
Author: Jin, Wei; Pun, Kong-Pang

Journal: MICROELECTRONICS JOURNAL. 2023; Vol. 131, Issue , pp. -. DOI: 10.1016/j.mejo.2022.105666
7、CMOS variable-gain phase shifter based on time-varying vector-sum method and its application to Ku-band phased array
Author: Cheng, Guoxiao; Zhang, Jin-Dong; Chen, Qiaoyu; Sima, Boyu; Wu, Wen

Journal: MICROELECTRONICS JOURNAL. 2023; Vol. 131, Issue , pp. -. DOI: 10.1016/j.mejo.2022.105672
8、A novel-16-60 V input common-mode voltage current-shunt monitor?
Author: Duan, Quanzhen; Duan, Ying; Kong, Dameng; Li, Liwei; Huang, Shengming

Journal: MICROELECTRONICS JOURNAL. 2023; Vol. 131, Issue , pp. -. DOI: 10.1016/j.mejo.2022.105663